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 2SA2058
TOSHIBA Transistor Silicon PNP Epitaxial Type
2SA2058
High-Speed Switching Applications DC-DC Converter Applications Strobe Applications
* * * High DC current gain: hFE = 200 to 500 (IC = -0.2 A) Low collector-emitter saturation voltage: VCE (sat) = -0.19 V (max) High-speed switching: tf = 25 ns (typ.) Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Base current Collector power dissipation Junction temperature Storage temperature range DC t = 10 s DC Pulse Symbol VCBO VCEO VEBO IC ICP IB PC (Note) Tj Tstg Rating -20 -10 -7 -1.5 -2.5 -150 500 750 150 -55 to 150 Unit V V V A mA mW C C
JEDEC JEITA TOSHIBA
2-3S1A
Weight: 0.01 g (typ.)
Note: Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu area: 2 645 mm )
Electrical Characteristics (Ta = 25C)
Characteristics Collector cut-off current Emitter cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter saturation voltage Collector output capacitance Rise time Switching time Storage time Fall time Symbol ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) Cob tr tstg tf Test Condition VCB = -20 V, IE = 0 VEB = -7 V, IC = 0 IC = -10 mA, IB = 0 VCE = -2 V, IC = -0.2 A VCE = -2 V, IC = -0.6 A IC = -0.6 A, IB = -20 mA IC = -0.6 A, IB = -20 mA VCB = -10 V, IE = 0, f = 1 MHz See Figure 1 circuit diagram. VCC -6 V, RL = 10 - -IB1 = IB2 = -20 mA Min -10 200 125 Typ. 12 50 115 25 Max -100 -100 500 -0.19 -1.10 ns V V pF Unit nA nA V
1
2001-10-29
2SA2058
Marking
20 s IB2 IB1 Input IB1 VCC RL Output
WM
IB2 Duty cycle < 1%
Figure 1
Switching Time Test Circuit & Timing Chart
2
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2SA2058
IC - VCE
-2.4 -80 -60 -40 Common emitter Ta = 25C Single nonrepetitive pulse -20 10000 Common emitter VCE = -2 V Single nonrepetitive pulse
hFE - IC
-2.0
(A)
hFE
IC
-1.6
1000 25
Ta = 100C
Collector current
-1.2
-10 -8 -6 -4 IB = -2 mA
DC current gain
-55 100
-0.8
-0.4 10 -0.001
0 0
-0.2
-0.4
-0.6
-0.8
-1.0
-1.2
-0.01
-0.1
-1
Collector-emitter voltage VCE
(V)
Collector current
IC
(A)
VCE (sat) - IC
-1 Common emitter Single nonrepetitive pulse -0.1 Ta = 100C 25 -0.01 -10 Common emitter IC/IB = 30 IC/IB = 30
VBE (sat) - IC
Collector-emitter saturation voltage VCE (sat) (V)
Base-emitter saturation voltage VBE (sat) (V)
Single nonrepetitive pulse -1
-55
Ta = 100C 25 -0.1
-55
-0.001 -0.001
-0.01
-0.1
-1
-0.01 -0.001
-0.01
-0.1
-1
Collector current
IC
(A)
Collector current
IC
(A)
IC - VBE
-2.0 Common emitter VCE = -2 V
IC Collector current
(A)
-1.6 Single nonrepetitive pulse -1.2
-0.8 Ta = 100C -0.4 25 -55
0 0
-0.4
-0.8
-1.2
-1.6
Base-emitter voltage VBE
(V)
3
2001-10-29
2SA2058
rth - tw
1000
Transient thermal resistance rth (C/W)
100
10 Curves should be applied in thermal limited area. Single nonrepetitive pulse area: 645 mm2) 1 0.001 0.01 0.1 1 10 100 1000 Ta = 25C Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu
Pulse width
tw
(s)
Safe Operating Area
-10
IC max (pulsed)
10 ms 1 ms
(A)
IC max (continuous) -1 DC operation * (Ta = 25C) : Single nonrepetitive pulse Ta = 25C -0.1 Note that the curves for 100 ms*, 10 s* and DC operation* will be different when the devices aren't mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2). These characteristic curves must be derated linearly with increase in temperature. -0.01 -0.1 -1 100 ms* 10 s*
Collector current
IC
-10
VCEO max
-100
Collector-emitter voltage VCE
(V)
4
2001-10-29
2SA2058
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others.
* The information contained herein is subject to change without notice.
5
2001-10-29


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